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The Sysmex FPIA 3000 is a fully automated dynamic flow particle imaging instrument for the rapid and reliable measurement of the shape and size of particles in suspension.


Designed with the needs of a busy QC lab in mind, the FPIA 3000 makes size and shape analysis of particles in suspension a straightforward and routine task. All of the sample preparation, measurement and cleaning can be taken care of by the instrument itself. Equally the unparalleled image quality and flexible software makes it a highly effective R&D tool.

  • Measures materials from 0.8µm to 300µm.
  • Fully automated analysis and self-cleaning in approximately 2.5 minutes.
  • Unique sheath flow technology keeps even the smallest particles in sharp focus.
  • Simple easy-to-use operation, ideal for routine QC analysis.
  • In-built sonication option for difficult to disperse samples.

How it works

Using the FPIA 3000 is an extremely simple 3 step process:

  1. The user adds their sample in the form of an aqueous or non-aqueous suspension to the instrument using a pipette: typically between 1-5ml of sample is required.
  2. The measurement, data analysis and instrument cleaning all run automatically via an electronic SOP to ensure consistent results time after time.
  3. Further data analysis, report printing and data export can be performed after the measurement if required.



Dynamic flow particle imaging.
Particle size:
0.8µm – 300µm.*
Particle properties measured:
Size, Shape, Transparency.
Dispersion mechanism:
Stirred with ultrasound option.
Particle flow:
Hydrodynamic focused sheath flow.
Sheath liquid (standard):
Aqueous ‘Particle Sheath Reagent’, methanol, ethanol, isopropyl alcohol, ethylene glycol solution (25%)
Sheath liquid (solvent option):
Compatible with most commonly used solvent dispersants such as: Toluene, Acetone, Heptane and Hexane
Maximum Measurement Time:
< 3 minutes including self-cleaning cycle.

Technical specifications

Light source:
White light, brightfield, 60Hz strobe.
CCD array.
10x (standard): 1.5µm – 40µm High power (x2) 8µm – 160µm Low power (x0.5) 20x(option): 0.8µm – 20µm High power (x2) 4µm – 80µm Low power (x0.5) 5x(option): 3µm – 80µm High power (x2) 16µm – 300µm Low power (x0.5)


Dimensions (W, D, H):
900mm x 475mm x 455mm
100/240 v, 50/60 Hz
Operating temperature (°C):
+15 to +30 °C
30–85% RH
Regulatory testing:
Sample dependent


When you purchase a Malvern product we understand that this is just the first stage of a working relationship that will last for the lifetime of the instrument. Some customers just need to ask an occasional question or to download a software upgrade, whilst others require a comprehensive support contract with priority call out and fixed cost of ownership. Whatever your situation Malvern will provide the right support for you.

Help Desk

  • Telephone and email support.
  • Operators who take responsibility for your call and ensure your query is answered. 


  • On Site training courses
  • Classroom training
  • E-learning

Resource center

  • Application notes
  • Technical notes
  • On demand presentations
  • Live webinars

Software downloads

  • A simple mechanism for receiving updates and new features

Platinum and Gold Service Contracts

  • Protection from the cost of downtime
  • No time lost in obtaining help when you need it
  • Fixed cost of ownership

Bronze Service Agreements

  • Protect the value of your investment
  • Reduce the risk of downtime
  • Protect the validity of your data

Resource center search

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Imaging Masterclass 2: Sample preparation techniques for particle size and shape measurements Webinar - Recorded (English)

For successful sample characterisation by image analysis, as with any other analytical technique, good sample preparation is critical. In this webinar we will discuss best practise in method development and describe a number of dispersion methods for...

Morphologi G3,Sysmex FPIA-3000
Date recorded:
March 25 2014

Keywords: English Morphologi G3 Sysmex FPIA-3000 Particle shape Particle size Image analysis Webinar - Recorded Eastern Time 

Characterisation of Phosphor particles for LED lighting using the Sysmex FPIA-3000 Application Note (English)

The performance and ease of manufacture of LED devices is affected by the size and shape of phosphor particles. Measurement of size and shape distributions is therefore desirable to aid product development and production control.

Keywords: English Application Note Sysmex FPIA-3000 Particle shape Particle size Image analysis Semiconductors 

A basic guide to particle characterization Webinar - Recorded (English)

This presentation introduces the main particle characterization tehniques currently used in industry and academia, the basic theoretical concepts of particle size analysis as well as aspects of its practical application.

Mastersizer range,Morphologi G3,Sysmex FPIA-3000,Zetasizer APS,Zetasizer Nano range,Zetasizer µV
Date recorded:
August 19 2013

Keywords: English Mastersizer range Morphologi G3 Sysmex FPIA-3000 Particle shape Particle size Zeta potential Dynamic Light Scattering Electrophoretic Light Scattering Image analysis Laser diffraction Webinar - Recorded Greenwich Time Zetasizer APS Zetasizer Nano range Zetasizer µV 

Introducing the Malvern particle characterization toolkit : How to choose the right particle characterization tool for my needs Webinar - Recorded (English)

Choosing the right technique for a your particle characterization needs can seem like a daunting task. In this presentation we aim to simplify and demystify the process, showing you the advantages and limitations of a variety of techniques.

Mastersizer range,Morphologi G3,Sysmex FPIA-3000,Zetasizer Nano range
Date recorded:
November 13 2012

Keywords: English Mastersizer range Morphologi G3 Sysmex FPIA-3000 Particle size Dynamic Light Scattering Image analysis Laser diffraction Webinar - Recorded Greenwich Time Zetasizer Nano range 
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