In this presentation, we explore the practical aspects of sieving method – the advantages and disadvantages. We also compare the method to other techniques such as laser diffraction indicating the increased wealth of information that can be obtained with these more modern instrumental techniques.

Speakers

Dr. Alan Rawle has more than a quarter of a century’s experience in various aspects of technology. He started his academic life in industrial chemistry gaining a Ph.D in supported alloy catalysts where colloidal sized material was the norm. After a career in liquid crystal displays engineering he moved onto technology transfer and thence on to electro-optics, lasers, signal processing and ultimately particle sizing characterization techniques. He has spent many years working on the ISO TC24/SC4 (Particles Sizing techniques excluding sieving) committee which has been responsible for such standards as ISO 13320-1 dealing with laser diffraction and ISO 13321 dealing with photon correlation spectroscopy. He is the Convener of WG10, Small Angle X-Ray Scattering Methods. After his move across the pond from the U.K. to the U.S.A., he has also become involved in ASTM activities. He is currently CoChair of E 56.02, the Characterization SubCommittee of the ASTM E56 Committee on Nanotechnology and is also a member of 3 other ASTM committees. He and his team are involved in supporting Malvern Instruments’ customers worldwide.