Near Infrared Chemical Imaging to characterize controlled release devices

Near-Infrared Chemical Imaging is an effective technique that can be used to elucidate the spatial distribution of chemical components in a mixed system. Since the performance of products, especially controlled-release devices, is often related to the distribution of chemical components, results obtained from NIR-CI can be directly correlated with functionality. NIR-CI can be used to effectively measure performance-related properties including coating thickness, homogeneity, and integrity, as well as the sample chemical composition and gradients of a varying-compositional component. This presentation will provide instructional background on how to utilize NIR-CI to characterize such properties.

Type:	Chemical Imaging
Duration:	35 minutes
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